The cathode is metal heated by a filament to roughly 1,000 degrees
Celsius. Hot metal throws electrons off its surface.
The anode, or plate, sits opposite at a positive voltage, often 100 to
300 volts, so electrons stream across the empty space. That is the current.
The grid, a fine mesh, sits in the path. A small negative voltage on it
pushes electrons back, thinning the stream.
Because the grid is negative, almost no current flows into it. Large plate
current, tiny grid current. That is amplification.
Now the costs. Every heater runs constantly, so ENIAC drew about 150
kilowatts, much of it just keeping filaments hot.
Filaments burn out, because that is physically what they are. And the
machine cannot be used the instant you switch it on: cathodes need tens of
seconds to reach temperature. That is warm-up time.
John Ambrose Fleming patented the thermionic diode in 1904. Lee de Forest
added the control grid in 1906, producing the triode he called the Audion.
ENIAC used ordinary octal-base radio tubes: 6SN7 flip-flops in the decimal
accumulators, with 6L7, 6SJ7, 6SA7 and 6AC7 types in logic roles.
ENIAC figure
Value
Vacuum tubes
About 17,468
Crystal diodes
7,200
Resistors
70,000
Capacitors
10,000
Soldered joints
About 5,000,000
Power draw
150 kW
Weight
About 30 short tons
The tube count is quoted differently by different sources. 17,468 is the
usual figure for the machine as built. Penn and several standard references
round it to 18,000, and the count changed over its working life.
Early on, several tubes failed almost every day and ENIAC was unusable
roughly half the time. High-reliability tubes arrived in 1948, after which
failures dropped to about one every two days.
The longest failure-free run was 116 hours, close to five days, in 1954.
ENIAC was switched off for the last time on 2 October 1955.
The honest version: failures were reduced partly by never switching the
machine off. Thermal cycling, not steady running, kills filaments.
A 6SN7 heater draws 6.3 V at 0.6 A, about 3.8 W per tube. Multiplied by
roughly 17,000 tubes that is about 65 kW of pure heater load, a large share
of the 150 kW total.
Picture a cinema where every seat is taken. Nobody can move. That is pure
silicon.
Make one person stand in the aisle. That is N-type: a free electron that
can walk anywhere.
Now instead take one person out of a seat in the middle, leaving it empty.
That is P-type.
Nobody is standing, but the empty seat moves: the person to its left slides
over, so the gap travels across the room while each person shifts one
place. The empty seat is the hole.
It is not a thing. It is an absence. But film only the gap and you would
swear a real object was moving, in the opposite direction to the people.
Also, holes are genuinely harder to push. In silicon a hole moves at
roughly a third the speed of an electron under the same push. Hold on to
that; it matters enormously later.
A phosphorus atom takes a silicon lattice site. It is a similar size, so
the crystal barely notices, and four of its five outer electrons pair with
the four silicon neighbours.
The fifth is only weakly bound, needing about 0.045 electron-volts to break
free. Room temperature heat energy is about 0.026 electron-volts, and given
how many attempts happen per second that frees essentially all of them.
The freed electron leaves behind a phosphorus atom with one more proton
than electron: a fixed positive ion.
Boron is the mirror image. It fills three bonds and leaves one incomplete.
An electron from a nearby bond hops in to complete it, so the gap moves,
and boron becomes a fixed negative ion.
So the picture is mobile carriers wandering, and charged ions frozen in
place. Section 4.3 depends entirely on that distinction.
The honest version: a hole is not a particle. It is the collective
behaviour of a nearly full band of electrons, which physics lets us
describe exactly as one positive particle with its own effective mass.
Silicon is a group 14 element with an indirect bandgap of 1.12 eV at 300 K
and an atomic density of 5.0 times 10 to the 22 per cubic centimetre.
Intrinsic carrier concentration ni at 300 K is about 1.0 times 10 to the 10
per cubic centimetre. Older texts quote 1.45e10; the lower value is the
modern accepted figure.
The mass action law holds in equilibrium: n times p equals ni squared. So
N-type doping of 1e16 gives n about 1e16 and p about 1e4 per cubic
centimetre.
Mobility at 300 K in lightly doped silicon: electrons about 1,400 cm
squared per volt-second, holes about 450. A ratio near 3 to 1.
Region
Doping (per cm3)
Role
Lightly doped body
1e15 to 1e16
Substrate
Channel or well
1e17 to 1e18
Sets threshold
Source and drain
1e20 to 1e21
Low resistance
Measurement tools: a four-point probe gives sheet resistance in ohms per
square; secondary ion mass spectrometry (SIMS) gives the dopant depth
profile.
Note the convention: N-type and P-type name the majority carrier, not a net
charge. Both materials are electrically neutral in bulk.
Take N-type silicon, with spare electrons, and P-type silicon, with holes,
and join them as one crystal with the doping changing partway through.
Electrons on the N side are crowded and the P side has almost none, so they
spill across. Holes spill the other way.
That leaves a thin strip near the boundary with no free carriers at all,
called the depletion region.
But the fixed ions remain, positive on the N side and negative on the P
side, so a voltage now exists across that strip. Nobody applied it. It
built itself, and it is a barrier to further spilling.
Push current one way and the barrier shrinks, so current flows easily. Push
the other way and the barrier grows, so almost nothing flows.
A device that passes current one way and blocks the other is a diode.
Picture two adjoining rooms at a party with an open doorway. The left room
is packed, the right nearly empty.
People spill through the doorway, because crowds spread out. That is
diffusion. But every person who crosses must hand over their coat at the
door, and the coats pile up until crossing stops.
The coat pile is the depletion region. It builds itself out of what already
crossed, and it is what stops any more crossing.
A doorman who pushes people toward the doorway compresses the pile and
crossing resumes. That is forward bias.
Where this comparison breaks: coats are a passive obstruction, but the
depletion region is an electric field, acting instantly and at a distance.
At the moment of joining, electrons diffuse into the P side and holes
diffuse into the N side.
Every electron that leaves the N side leaves a fixed positive donor ion
behind, and every hole that leaves the P side leaves a fixed negative
acceptor ion. Neither ion can follow.
So a wall of positive fixed charge builds on the N side of the boundary and
a wall of negative fixed charge on the P side.
Separated charge makes an electric field that pushes electrons back toward
the N side, exactly opposing the diffusion that created it. Balance is
reached when the two cancel, and nothing net flows.
The voltage across the region is the built-in potential, typically 0.6
to 0.8 volts in silicon. You cannot measure it with a voltmeter: the two
metal-to-silicon contacts produce equal and opposite offsets.
Apply an external voltage with the P side positive and the depletion region
narrows, the barrier drops, and carriers flood across.
Apply the opposite and the region widens, the barrier grows, and majority
carriers cannot get over it at all.
The honest version: current is not simply blocked one way. Diffusion and
drift currents always flow in both directions. Diode current is the small
difference between two large, nearly equal opposing flows.
The Shockley diode equation: I = Is times (exp(V divided by (n times VT))
minus 1).
VT is the thermal voltage, kT divided by q, equal to 25.85 mV at 300 K. Is
is the reverse saturation current, typically 1e-12 to 1e-15 A for small
silicon diodes, roughly doubling every 10 K. n is the ideality factor,
between 1 and 2.
The decade-per-60-mV rule follows directly: 1 times 25.85 mV times 2.303
equals 59.5 mV.
Built-in potential is Vbi = VT times ln(Na times Nd divided by ni squared).
With Na and Nd both 1e17 and ni equal to 1e10, Vbi = 0.02585 times 32.2,
which is 0.83 V.
Diode type
Forward drop
Typical use
Silicon PN
0.6 to 0.7 V
General rectifier
Schottky
0.2 to 0.45 V
Fast switching
Germanium PN
0.25 to 0.3 V
Legacy detectors
Red LED
About 1.8 V
Indicator
Blue LED
2.8 to 3.4 V
Lighting, display
Reverse breakdown has two mechanisms: Zener tunnelling below about 5 V with
a negative temperature coefficient, and avalanche multiplication above
about 6 V with a positive one. Near 5.6 V they cancel, which is why 5.6 V
Zener diodes were once used as temperature-stable references.
A Schottky diode is a metal-semiconductor junction with no stored minority
charge, so it has essentially no reverse recovery. That is why it dominates
high-frequency switching supplies.
To observe the curve: a curve tracer or a source measure unit sweep. In
simulation, a SPICE DC sweep with the .DC directive plots it from the model
parameters IS, N, RS and BV.
Bell Telephone Laboratories had a business problem in the 1940s. Long
distance calls needed amplifiers, amplifiers meant vacuum tubes, and tubes
kept dying.
On 16 December 1947, two of their people made one work.
Their device was a small slab of very pure germanium with two gold contacts
pressed onto its surface, extremely close together.
A signal on one contact controlled a larger current through the other,
amplifying by up to about a hundred times.
On 23 December 1947 they demonstrated it to management. Their group leader,
William Shockley, called it a magnificent Christmas present.
Bell Labs kept it quiet for six months, then announced it at a New York
press conference on 30 June 1948.
Imagine controlling a river using only the shape of the riverbed just under
the surface, without touching the water.
That was the field-effect idea, tried since the 1920s. It kept failing and
nobody knew why.
Bardeen worked out why in 1947. The semiconductor surface was covered in
trapped electrons acting like a shield.
So Bardeen and Brattain stopped pushing from outside and went in through
the surface directly, with two metal points almost touching.
Where this comparison breaks: the point-contact device is not really a
field-effect transistor at all, and exactly how it worked was argued about
for years afterwards.
Brattain wrapped gold foil around the point of a small plastic wedge.
He cut the foil at the tip with a razor blade, leaving two gold edges about
50 micrometres apart. That is roughly half the width of a human hair.
He pressed the wedge onto a slab of high-purity germanium with a spring.
One gold edge was the emitter, the other the collector, and the germanium
slab itself was the base.
They measured a power gain. That is the test that matters; voltage gain
alone can be had from a transformer.
Shockley was the group leader who had pushed the field-effect programme for
years, and it had failed repeatedly. The device that finally worked was
built by two of his subordinates, using Bardeen’s surface-state insight, in
a direction Shockley had not chosen.
Then Bell Labs lawyers examined the patent and found Shockley’s own
field-effect writing was uncomfortably close to patents Julius Edgar
Lilienfeld had filed in the 1920s.
To keep the patent safe they left Shockley’s name off it. The application
“Three-electrode circuit element utilizing semiconductive materials”, with
a priority date of 26 February 1948, named Bardeen and Brattain.
Shockley was furious. Over the New Year he worked alone, largely in a
Chicago hotel room, and in January 1948 conceived a better device.
Instead of two metal points scratching a surface, he proposed a sandwich of
three doped layers grown into one crystal: the junction transistor. His
own application carries a priority date of 26 June 1948.
It was more robust and manufacturable, and it made the point-contact device
obsolete. Gordon Teal and Morgan Sparks at Bell Labs produced working
grown-junction transistors in 1951. Bardeen left for the University of
Illinois that year.
In 1956 all three shared the Nobel Prize in Physics, “for their researches
on semiconductors and their discovery of the transistor effect.”
Where experts disagree: some historians treat Shockley as the essential
figure, since the junction transistor is the ancestor of everything since.
Others treat him as a manager who claimed a result he did not produce. The
safest reading is that invention and improvement both mattered, and came
from different people.
The 1947 device was a point-contact transistor on N-type germanium with two
gold point contacts about 50 micrometres apart, amplifying the input by up
to about 100 times.
Germanium, not silicon. Germanium has a 0.66 eV bandgap and much higher
carrier mobility, and in 1947 it could be purified far better than silicon.
Gordon Teal at Texas Instruments announced the first commercial silicon
transistor in 1954. Silicon’s wider 1.12 eV bandgap gives far better
high-temperature behaviour.
The Regency TR-1, announced on 18 October 1954, was the first commercial
transistor radio. It used four TI germanium transistors and sold for
$49.95.
Shockley left Bell Labs in 1955 and founded Shockley Semiconductor
Laboratory in Mountain View, California, in 1956.
In 1957 eight of his staff resigned over his management and founded
Fairchild Semiconductor. Fairchild’s descendants include Intel and AMD.
That is the direct reason Silicon Valley is where it is.
John Bardeen won a second Nobel Prize in Physics in 1972, with Leon Cooper
and John Robert Schrieffer, for the BCS theory of superconductivity. He
remains the only person to have won the physics prize twice.
Picture a wide fast river with a narrow island in the middle.
Water hitting the island drains away down a small side channel. That side
channel is the base current.
Because the island is so narrow, almost all the water sweeps past it and
reaches the far bank. Maybe two hundred litres arrive for every one that
drains.
But the side channel must keep draining. Block it and the whole flow stops.
And the small side flow is never optional. It is a permanent cost, and
section 4.7 is about a device that removed it.
Take a 2N3904, one of the most common small NPN transistors ever made. Its
current gain, beta, is roughly 100 to 300 at 10 milliamps.
Say we want to switch a 100 milliamp load. Use the worst-case beta of 100,
never the typical value, so base current needed = 100 mA divided by 100 = 1
mA.
In practice you overdrive by 5 times to force it hard on, so use 5 mA.
With a 5 V control signal, the base-emitter junction drops about 0.7 V, so
the resistor sees 4.3 V, and R = 4.3 V divided by 0.005 A = 860 ohms. Use
the standard value 820 ohms.
5V ---[820 ohm]--- base
|
100 mA load ---> collector
|
emitter --- ground
Base power : 5 mA x 0.7 V = 3.5 mW
Switch loss : 100 mA x 0.2 V = 20 mW
Total burnt : about 23.5 mW, continuously
Holding this one transistor on costs about 23.5 milliwatts forever, doing
nothing.
A billion of them would burn 23.5 megawatts. That is a power station, and
that number is why bipolar logic was never going to build a modern
processor.
In an NPN the emitter is heavily doped, the base thin and lightly doped,
and the collector moderately doped and physically larger.
Forward bias lowers the emitter-base barrier, so electrons flood from the N
emitter into the P base, where they are minority carriers and ought to
recombine.
But the base is thinner than a micrometre, so most cross it before meeting
a hole, and at the far edge the reverse-biased base-collector field sweeps
them straight into the collector.
So perhaps 99.5 percent arrive at the collector and 0.5 percent recombine
in the base and must be replaced by base current.
Beta is just the ratio of those two numbers. Lose 0.5 percent and beta is
about 200. Gain comes from geometry and doping, not magic.
Cut-off is when base-emitter voltage is below about 0.6 V. Nothing is
injected and the device is off.
The honest version: calling the BJT current-controlled is a convention, not
a law. The physics is exponentially controlled by base-emitter voltage. But
that exponential is so steep and so temperature-sensitive that designing
with base current is far more reliable, so everyone does.
The Ebers-Moll model describes the BJT. In forward active mode IC = Is
times exp(VBE divided by VT).
Common-emitter gain beta equals IC over IB. Common-base gain alpha equals
IC over IE. They relate as beta = alpha divided by (1 minus alpha).
Parameter
2N3904 typical
Meaning
hFE (beta)
100 to 300
Current gain
VCE(sat)
0.2 V
On-state drop
VBE(on)
0.65 to 0.75 V
Turn-on voltage
VCEO max
40 V
Breakdown limit
fT
About 300 MHz
Gain bandwidth
Bipolar logic families ran RTL, then DTL, then TTL. The 7400 series
launched by Texas Instruments in 1964 and dominated digital design for
twenty years.
Standard TTL dissipated roughly 10 mW per gate at rest; the 74LS low-power
Schottky family reduced this to about 2 mW. Emitter-coupled logic was
faster still at 25 mW or more per gate, and Cray supercomputers cooled it
with liquid.
Bipolar devices still dominate analogue and radio work: low noise, high
transconductance per unit current, excellent matching. They lost digital,
not everything. Silicon-germanium heterojunction bipolar transistors reach
fT above 300 GHz.
SPICE models BJTs with the Gummel-Poon model, which extends Ebers-Moll to
cover high injection and base-width modulation.
Almost every transistor in the device you are reading this on is a MOSFET.
It has three parts you must know. The source, where carriers come from.
The drain, where they go. The gate, which decides whether they go.
Because the gate is insulated, no current flows into it. It is a capacitor
plate, not a wire into the device.
Put a positive voltage on the gate of an N-channel MOSFET and its electric
field reaches through the insulator into the silicon below.
That field drags electrons up to the surface, forming a thin conducting
layer bridging source to drain. That layer is the channel.
Here is the point that changes everything. Because the gate is insulated,
holding the switch on costs no continuing current. You charge the gate once
and it stays.
Imagine a dry canal between two full reservoirs. Nothing can cross.
Lower the plate and it does not push water. Instead it pulls groundwater up
from below, filling the canal bed.
That is the gate, and that is why MOSFET logic can sit still without
burning power.
Where this comparison breaks: lowering a real plate costs energy each time
because of gravity, and so does switching a real gate, because its
capacitance must be charged and discharged. Holding is free; changing is
not.
Also, the insulator is not perfect. At modern thicknesses a few electrons
tunnel straight through. The plate leaks, slightly.
The channel is the dashed strip. It does not exist until the gate says so.
Now real numbers. Threshold voltage, the gate voltage at which the channel
appears: 0.4 V. Supply: 1.0 V. Channel length L: 20 nanometres. Channel
width W: 100 nanometres.
Below 0.4 V on the gate the device is off, passing only leakage.
At 1.0 V on the gate the overdrive is 1.0 minus 0.4, which is 0.6 V, and
the device is fully on.
Double the width to 200 nanometres and on-current doubles, because a wider
channel is a wider pipe.
Halve the length to 10 nanometres and on-current doubles too, because a
shorter pipe has less resistance.
That is why engineers speak of the W over L ratio. It is the shape knob for
strength.
Start with the gate at zero volts, on an N-channel device built in P-type
silicon. The body is full of holes and the two N+ islands are full of
electrons.
Source to body is one PN junction and body to drain is another, facing the
other way. Two back-to-back diodes cannot conduct either direction, so the
device is firmly off.
Raise the gate a little. The field pushes holes downward, away from the
surface, which is now depleted: no holes, no electrons. Still off, but the
barrier is thinning.
Raise the gate more and the field starts pulling electrons up to the
surface. Electrons in P-type silicon are minority carriers and very rare,
but the field only needs a thin layer.
At some gate voltage the electron count at the surface equals the hole
count in the bulk. That point is the threshold voltage.
Push past it and electrons outnumber holes at the surface. The surface has
stopped behaving as P-type and started behaving as N-type.
That flip is called inversion, and it is the heart of the device. The
material did not change. Its carrier population did.
Now source, channel and drain are all N-type. One continuous path. Current
flows, and what happens next depends on the drain voltage.
If drain voltage is small, the channel is roughly even from end to end and
the device behaves as a resistor whose value the gate sets. That is the
linear or triode region.
Raise drain voltage and the channel is squeezed at the drain end, because
the gate-to-channel voltage there is smaller. When its thickness there
reaches zero, the device has reached pinch-off.
Past that, raising drain voltage barely raises current. The device behaves
as a current source set by the gate. That is the saturation region.
Careful, this word is a trap. In a BJT, saturation means fully on with the
lowest voltage drop. In a MOSFET it means pinched off at constant current.
Same word, opposite feeling.
A PMOS device is the mirror image: P+ source and drain in an N-type
well, turned on by a negative gate voltage relative to the source, which
inverts the surface to P-type.
The honest version: “the channel disappears at pinch-off” is not quite
true. A thin high-field region forms at the drain end and carriers are
swept across it. Current does not stop, it stops increasing.
Julius Edgar Lilienfeld filed the first field-effect patents in the mid
1920s and Oskar Heil filed a British patent in 1934. Neither produced a
working device.
Shockley’s 1945 field-effect attempts failed. Bardeen’s 1947 surface state
theory explained why: interface traps pinned the Fermi level and screened
the applied field.
The solution was a clean thermally grown silicon dioxide interface. Mohamed
Atalla and Dawon Kahng at Bell Labs built the first working MOSFET in 1959
and reported it in 1960.
Linear region, long-channel model: ID = mu times Cox times (W over L) times
((VGS minus Vth) times VDS minus VDS squared over 2), for VDS below VGS
minus Vth.
Saturation region, long-channel model: ID = one half times mu times Cox
times (W over L) times (VGS minus Vth) squared, for VDS at or above VGS
minus Vth. Cox is gate oxide capacitance per unit area, the oxide
permittivity divided by oxide thickness tox.
The square law is a long-channel result. Modern short-channel devices are
velocity saturated, so drain current is close to linear in (VGS minus Vth),
not quadratic. Textbooks teaching only the square law are teaching a device
that stopped being manufactured decades ago.
Below threshold the device is not off. Subthreshold current falls
exponentially, at a rate called subthreshold swing S, in millivolts per
decade.
S has a hard floor of ln(10) times kT over q, which is 59.6 mV per decade
at 300 K. Real planar devices reach 70 to 100; FinFETs reach about 65 to
70.
That floor is thermodynamic, not an engineering limit. It is the single
biggest reason supply voltage stopped scaling, and therefore the reason for
the power wall in section 4.10.
Intel reported reaching 1.2 nm of silicon dioxide, about five atomic
layers, on its 65 nm process. Below that, direct tunnelling leakage became
intolerable.
Think of a sink with a tap above and a plug below, joined by one lever.
Push the lever one way and the tap opens while the plug closes, so the
basin fills.
The mechanism guarantees tap and plug are never open together, so water
never runs straight down the drain.
Where this comparison breaks: during the flick of the lever both really are
slightly open for an instant. That overlap is called crowbar or
short-circuit current, and it is a real cost in fast circuits.
VDD (the supply, logic 1)
|
+----+----+
IN ----| PMOS | on when IN is 0
+----+----+
|
+-------------> OUT
|
+----+----+
IN ----| NMOS | on when IN is 1
+----+----+
|
GND (ground, logic 0)
IN = 0 -> PMOS on, NMOS off -> OUT pulled to VDD = 1
IN = 1 -> PMOS off, NMOS on -> OUT pulled to GND = 0
Now calculate the power a real chip burns. The formula is P = alpha times C
times V squared times f.
C is the capacitance being charged, V the supply voltage, f the clock
frequency, and alpha the activity factor, the fraction of nodes that change
on a given tick.
Take a plausible processor core cluster: one billion switching nodes, 0.5
femtofarads each, 1.0 V supply, 3 GHz clock, activity factor 0.05.
Capacitance switched per cycle = 0.05 times 1e9 times 0.5e-15 farads = 2.5
times 10 to the minus 8 farads, that is 25 nanofarads.
Energy per cycle = C times V squared = 25 nF times 1.0 squared = 25
nanojoules.
Power = 25 nanojoules times 3 billion cycles per second = 75 watts.
Now change one number. Raise the supply to 1.2 V and power scales with V
squared: 75 times 1.44 = 108 watts, for zero extra speed.
When the input flips from 1 to 0, the PMOS turns on and connects the output
wire to the supply.
That output wire, plus the gates of everything it drives, forms a
capacitance that must be charged from 0 volts up to the supply voltage.
Charging a capacitor C to voltage V stores one half C V squared and burns
the same amount as heat in the transistor doing the charging. On the way
back, the NMOS dumps the stored half to ground and that is lost too.
So a full 0 to 1 to 0 cycle costs C times V squared in total. That is where
the formula comes from. Nothing at all is spent while the output sits
still, which is the property bipolar logic could never offer.
Two other losses exist. First, crowbar loss: for the moment when the input
is halfway, both transistors conduct and a spike passes through.
Second, and worse, leakage. Every off transistor passes a small current,
and every gate leaks a tunnelling current through its oxide.
In the 1990s leakage was negligible. By the 90 nanometre generation, around
2003 to 2005, it had become a large share of total chip power.
CMOS was invented by Frank Wanlass and Chih-Tang Sah at Fairchild in 1963.
Their ISSCC paper described it as “nanowatt logic”.
US patent 3,356,858 was filed 18 June 1963 and issued 5 December 1967. RCA
shipped the CD4000 logic family in 1968.
Dynamic power: P_dyn = alpha times C_L times VDD squared times f. Static
power: P_static = VDD times I_leak, summed over every device. Short-circuit
power is typically 5 to 15 percent of dynamic power.
Leakage components are subthreshold conduction, gate oxide tunnelling,
junction band-to-band tunnelling, and gate-induced drain leakage (GIDL).
Subthreshold leakage rises exponentially as threshold voltage falls, at
roughly one decade per S millivolts, with S about 70 mV per decade.
Era
Node
Supply
Leakage share
1990
800 nm
5.0 V
Under 1 percent
2000
180 nm
1.8 V
A few percent
2004
90 nm
1.2 V
20 to 40 percent
2010
32 nm HKMG
1.0 V
Reduced again
2024
3 nm GAA
0.7 V
Managed by design
Mitigations in current use: high-k metal gate from Intel’s 45 nm in 2007,
multi-threshold cell libraries, power gating with sleep transistors, clock
gating, dynamic voltage and frequency scaling, and FinFET or nanosheet
geometry for better electrostatic control.
Why clocks stopped climbing: Intel’s Pentium 4 Prescott reached 3.8 GHz in
November 2004 and stopped there.
In May 2004 Intel cancelled the Tejas and Jayhawk projects, which had aimed
at much higher clock rates, and redirected to dual-core designs. The first
dual-core desktop part, the Pentium D, shipped in May 2005.
The reason is arithmetic. Raising frequency requires raising voltage to
keep timing closed, and power then rises with roughly the cube of
frequency.
Two cores at 3 GHz do more total work than one core at 4.5 GHz for less
power, provided the software can use them. That proviso is the entire
subject of parallel programming.
Top desktop parts in 2025 boost to roughly 5.7 to 6.0 GHz, about 1.5 times
the 2004 peak across twenty years. In the twenty years before 2004, clock
rates rose more than a thousand times.
# read package energy counter, microjoules, Intel RAPL
cat /sys/class/powercap/intel-rapl:0/energy_uj
# per-core frequency, temperature and package watts
sudo turbostat --interval 1
A light switch has two positions and you flip past the middle quickly. That
is digital.
A dimmer sits deliberately in the middle, where a small turn makes a
noticeable change. That is analogue.
Where this comparison breaks: a mechanical dimmer wastes heat in proportion
to how much it dims, and so does a transistor in its middle region, because
it is dropping voltage while passing current.
That is why a class A audio amplifier is warm with no music playing, and
why digital chips never sit in the middle if they can help it.
The transfer curve plots output voltage against input voltage for one
CMOS inverter. Read it left to right.
Input
Output
Region
0.0 V
1.0 V
Flat, logic 1 out
0.40 V
0.95 V
Starting to move
0.50 V
0.50 V
The cliff, high gain
0.60 V
0.05 V
Nearly done
1.0 V
0.0 V
Flat, logic 0 out
At 0 V in, the NMOS is off and the PMOS fully on, so the output sits at the
full supply and the curve is flat. At about 0.5 V, the switching point, it
plunges almost vertically to near 0 V, then flattens again.
So the curve is flat, then a cliff, then flat again.
Digital design wants the two flat ends. Flat means a sloppy input still
gives a clean output. That property is noise margin, and it is why digital
signals can be copied endlessly without decay.
Analogue design wants the cliff. Its slope is the voltage gain, often 20 to
50 for a simple CMOS inverter.
Bias an inverter at its switching point with a feedback resistor and you
have an amplifier, not a logic gate. This is a real technique, used in
crystal oscillator circuits.
In the flat regions one transistor is in its linear region acting as a
small resistance and the other is fully cut off.
Almost the full supply appears across the off device and almost none across
the on device, so current is essentially zero and so is power.
In the cliff region both devices are in saturation, acting as current
sources. Two opposing current sources fight, and the output swings wildly
for a small input nudge.
That is where gain comes from. It is not amplification of energy. The
energy comes from the supply, and the transistor is a valve deciding how
much of it reaches the output.
In the cliff region there is a real path from supply to ground, so current
flows and heat is produced. Digital circuits cross that region in tens of
picoseconds; analogue circuits sit in it and pay for it in heat.
The honest version: a transistor never amplifies power in the sense of
creating it. It modulates a large power flow using a small one. Gain is a
ratio of signals, never a violation of energy conservation.
Small-signal voltage gain of a CMOS inverter at its switching threshold is
minus (gm_n plus gm_p) times (ro_n in parallel with ro_p).
Intrinsic gain gm times ro for a single modern short-channel device is only
about 10 to 30, and it has fallen as nodes shrank. That is why analogue
design got harder, not easier, with scaling.
Noise margins: NMH = VOH minus VIH, and NML = VIL minus VOL. For standard
CMOS at 5 V, VIH is 3.5 V, VIL is 1.5 V, VOH is 4.9 V and VOL is 0.1 V,
giving margins near 1.4 V each way.
Radio front ends still commonly use bipolar or silicon-germanium devices
for low-noise amplifiers, because their transconductance per unit current
and their noise behaviour beat CMOS at the same power.
Where experts disagree: whether analogue functions should share the same
advanced node as the digital logic. Integration saves packaging and
interconnect; separate older nodes give better analogue devices and lower
cost. Chiplet packaging has shifted this argument, not settled it.
For about forty years transistors were flat. The channel lay along the top
surface of the wafer with the gate above it. That is a planar
transistor.
As transistors shrank, the flat design began to fail in a specific way. The
gate could only touch the channel from one side, the top, while the drain,
sitting right next to a very short channel, started to influence it too.
So the gate lost the argument. It could no longer switch the channel fully
off, and leakage rose sharply.
The fix was to change the shape: stand the channel up as a thin vertical
fin and wrap the gate around three of its sides. That is a FinFET.
The next step wraps the gate around all four sides, making the channel a
stack of thin horizontal ribbons with gate material threaded between them.
That is gate-all-around, also called nanosheet, and it is the current
leading-edge shape.
Imagine stopping water in a pipe by pressing with one hand from above.
Now use both hands and a thumb underneath. Three points of grip, much
better control.
Now imagine a ring clamp closing all the way around. Total control from
every direction.
Where this comparison breaks: the gate never squeezes anything. It only
produces an electric field. But “surrounding it more completely gives more
control” is exactly right.
Here is the timeline of the shape change, with companies and years.
Shape
First volume use
Who
Planar bulk
1960s to 2011
Everyone
SOI planar
From 1998
IBM, AMD
FinFET (Tri-Gate)
2012
Intel 22 nm
FinFET
2015
TSMC, Samsung
GAA nanosheet
2022
Samsung 3 nm
GAA nanosheet
2025
TSMC N2, Intel 18A
Intel announced its 22 nanometre Tri-Gate process on 4 May 2011 and shipped
Ivy Bridge processors using it in April 2012. That was the first
high-volume FinFET product.
Samsung began production with 3 nanometre gate-all-around, marketed as
MBCFET, in June 2022.
TSMC’s N2 process entered volume production in the fourth quarter of 2025.
It is TSMC’s first gate-all-around node.
The problem the shape solves has a name: short-channel effects.
When the channel is long, the gate alone sets the barrier between source
and drain. When it is very short, the drain’s own depletion region reaches
close to the source.
Now raising the drain voltage lowers the source barrier by itself, with no
help from the gate. That is drain-induced barrier lowering, or DIBL.
Wrapping the gate around more of the channel restores its authority,
because the gate’s field now dominates from several directions at once.
The results are all bad: threshold voltage drops as the channel shortens,
the subthreshold slope degrades so turn-off is less sharp, and off current
rises.
Silicon-on-insulator, or SOI, attacks a related problem differently. A
buried layer of oxide sits under the whole device, cutting off deep leakage
paths through the substrate, reducing junction capacitance, and removing
the latch-up failure mode entirely.
The gate insulator changed too, for a hard physical reason. Silicon dioxide
was thinned generation after generation to keep the gate’s grip strong, and
Intel reached 1.2 nanometres of it, about five atomic layers, at 65
nanometres.
Five atoms is not a film any more. Electrons tunnel straight through it and
leakage explodes.
The escape was a material with a higher dielectric constant, called
high-k, which can be physically thicker while giving the same
electrical coupling. Thicker means far less tunnelling.
Hafnium-based oxides have a dielectric constant around 20 to 25 against
3.9 for silicon dioxide, which buys back several atomic layers of
thickness.
High-k films do not work with polysilicon gates, so metal gates had to
return at the same time. Hence the paired name, high-k metal gate.
Intel introduced high-k metal gate at 45 nanometres in 2007 with the Penryn
family. Gordon Moore called it the biggest change to transistor technology
since the polysilicon gate in the late 1960s.
Intel’s published figures for that change: gate oxide leakage reduced more
than 10 times, source-to-drain leakage more than 5 times, and drive current
improved by more than 20 percent.
Equivalent oxide thickness (EOT) is the standard figure of merit: the
thickness of silicon dioxide that would give the same capacitance per area.
Modern EOT is around 0.8 to 1.0 nanometres, at a physical thickness of 2 to
3 nanometres.
FinFET geometry parameters are fin height, fin width (typically 5 to 8 nm)
and fin pitch (roughly 24 to 30 nm at recent nodes).
FinFET width is quantized. You cannot ask for 1.5 fins, so device strength
comes in integer multiples of one fin. That constrains circuit design in a
way planar devices never did. Nanosheet removes the quantization, because
sheet width is drawn continuously.
FD-SOI, fully depleted silicon-on-insulator, is a live alternative at 22
nanometres and below, offered by GlobalFoundries as 22FDX. It allows
back-bias tuning of threshold voltage at runtime, which FinFET cannot do.
Where experts disagree: whether FD-SOI or FinFET suits low-power and radio
products at moderate nodes. FinFET won the leading edge outright; FD-SOI
retains real advocates for internet-of-things and automotive parts.
Beyond nanosheet, the announced direction is CFET, stacking an NMOS device
directly on a PMOS device. As of 2026 that is active research and
pathfinding, not production.
A silicon atom is about 0.22 nanometres across, so a gate insulator one
nanometre thick is four or five atoms.
In 1971 the Intel 4004 held 2,250 transistors. In 2024 the Apple M4 held
about 28 billion. That is a factor of over twelve million in fifty-three
years.
Moore’s Law is the name for that trend. It is not a law of physics. It
is an observation about industry that turned into a plan.
It is also not about speed, despite what almost everyone says.
It has been slowing since around 2015. Doubling now takes closer to three
years than two, and each step costs far more than the last.
Imagine a printing press that gets twice as good every two years, so a page
holds twice as many words. For decades each new press also printed faster
and used no more electricity. Better in every direction, free.
Then something changed. The presses kept holding more words but stopped
getting faster, and started running hot.
That is exactly what happened to processors around 2005. Cores multiplied
because clock speed could not rise.
Where this comparison breaks: printing more pages in parallel always helps,
but computing in parallel only helps if the task can be split. Many cannot.
That limit is called Amdahl’s Law and it is not going away.
Here is the transistor count table, with real parts and real years.
Chip
Year
Transistors
Intel 4004
1971
2,250
Intel 8086
1978
29,000
Intel 80386
1985
275,000
Intel Pentium
1993
3.1 million
Pentium 4
2000
42 million
Core 2 Duo
2006
291 million
Apple A7
2013
About 1 billion
Apple M1
2020
16 billion
Apple M4
2024
28 billion
Nvidia GB200
2024
208 billion
Cerebras WSE-3
2024
4 trillion
Now count switching events. Take the Apple M4: 28 billion transistors, a 4
GHz clock, and an activity factor of 5 percent.
28e9 times 4e9 = 1.12 times 10 to the 20. Times 0.05 gives 5.6 times 10 to
the 18 switching events every second.
That is 5.6 billion billion switches per second, in a chip you can cover
with a thumb, drawing a few tens of watts.
The industry as a whole made about 250 times 10 to the 18 transistors in
2014, according to an IEEE Spectrum estimate. That is roughly 8 trillion
transistors manufactured every second of that year.
Gordon Moore, then at Fairchild, wrote an article for Electronics magazine
published on 19 April 1965, titled “Cramming more components onto
integrated circuits”.
His actual observation: the complexity for minimum component costs had
increased at a rate of roughly a factor of two per year, and he expected
that to continue for at least ten more years.
Read that carefully. “Complexity for minimum component costs” means the
number of components on the chip that is cheapest per component.
In 1975, at the IEEE International Electron Devices Meeting, Moore revised
it: doubling yearly until about 1980, then slowing to about every two
years.
The “every 18 months” version everyone quotes is not Moore’s. David House,
an Intel executive, said in 1975 that more transistors plus faster ones
would double performance about every 18 months.
Now the second law, the one that actually stopped. Robert Dennard and
colleagues at IBM published a 1974 paper on designing ion-implanted MOSFETs
with very small physical dimensions.
Their scaling rules: shrink every dimension by a factor k, shrink the
supply voltage by k, and raise the doping by k.
The consequences are beautiful. Area falls by k squared, delay falls by k,
power per device falls by k squared, and power per unit area stays
constant.
Constant power density is the magic line. It means you can double the
transistor count, run them faster, and the chip does not get hotter.
For roughly thirty years that held, and engineers came to treat it as
normal. It was not normal. It was a gift.
It ended because supply voltage could not keep falling. Supply voltage
must stay well above threshold voltage, and threshold voltage cannot fall
without subthreshold leakage rising exponentially.
Section 4.6 gave the reason: the 59.6 millivolt per decade thermal floor.
That is physics, at any temperature above absolute zero. So voltage
stalled near 1 volt around 2005, having fallen from 5 volts.
Transistors kept shrinking, but the V squared term stopped shrinking.
Power density therefore began to climb. That is the power wall.
The industry’s answer was to stop raising clock speed, add cores, and
leave large parts of the chip powered down at any moment. That last
practice has a name: dark silicon.
Dennard constant-field scaling, with factor k greater than 1: dimensions
divided by k, voltage divided by k, doping times k, current divided by k,
capacitance divided by k, delay divided by k, power per device divided by k
squared, power density unchanged.
Post-Dennard reality since roughly 2005: dimensions still divided by k, but
voltage nearly constant, so power density rises by roughly k squared.
Node names are marketing, not measurements. This is a convention, not a
standard. No physical feature on a “3 nm” process measures 3 nanometres.
The meaningful density metrics are contacted poly pitch (CPP), metal 1
pitch and cell height in track count. Leading nodes in 2025 sit around 45
to 50 nm CPP and 20 to 24 nm minimum metal pitch. Transistor density is
quoted around 200 to 300 million per square millimetre.
Cause of slowdown
Effect
Atomic dimensions
Variability, few dopants
EUV tool and mask cost
Cost per wafer rises
Fab capital cost
Above 20 billion dollars
Design and verification
NRE cost per chip rises
Interconnect resistance
Wires now limit delay
Interconnect is the underrated one. Copper resistivity rises sharply as
wire cross-sections approach the electron mean free path, so wire delay has
scaled far worse than transistor delay.
Where experts disagree, sharply: whether cost per transistor still falls at
the leading edge. Foundries state that it does. Several analysts argue it
has been roughly flat since the 28 nanometre node. Nvidia’s chief executive
said publicly in 2022 that Moore’s Law is dead. The honest answer is that
it depends on volume, yield and which costs you count.
Established fact: transistor counts per chip are still rising. Active
research: CFET stacking, two-dimensional channel materials such as
molybdenum disulphide, and backside power delivery. Marketing claim: any
specific node name, and any single number offered as “the density”.
Tools to observe scale in practice: lscpu and /proc/cpuinfo on Linux
for core and cache topology, and hwloc-ls for the physical layout.
# core count, cache sizes and topology
lscpu
# hierarchical view of packages, cores and caches
hwloc-ls
Imagine paper cost as much as gold. You would write only what mattered, on
both sides, in tiny letters.
Now imagine paper becomes free. You print drafts, take notes you never
read, and keep three copies of everything.
Where this comparison breaks: transistors are not free, only individually
cheap. A leading-edge chip design still costs hundreds of millions of
dollars to bring to market.
The cost simply moved. It moved off the individual component and onto the
design, the masks and the factory.
The price collapse comes from one structural fact: cost scales with wafer
area, not with transistor count.
Processing a wafer costs roughly the same whether the features on it are
large or small. The steps are the same steps.
So halving the linear dimension fits four times as many transistors on the
same wafer for nearly the same processing cost. That is the true engine of
Moore’s Law, and why Moore framed his observation in terms of cost per
component.
Yield modifies this. A wafer has a certain number of defects, and a bigger
die catches more of them, so bigger dies yield worse and not linearly. That
is why the industry moved to chiplets: several small high-yielding dies
packaged together.
The relationship has weakened in the last decade, because leading-edge
wafers now cost far more, thanks to extreme ultraviolet lithography tools
and masks.
So density still improves, but cost per transistor improves much less than
it used to, and at some nodes it may not improve at all.
The honest version: “transistors keep getting cheaper” was true without
qualification until roughly 2012. Since then it depends on the node, the
volume and who is doing the accounting.
Die cost is approximately wafer cost divided by (gross die per wafer times
yield).
Yield follows a negative binomial model: Y = (1 + (D0 times A) divided by
alpha) raised to the power minus alpha, where D0 is defect density per
square centimetre, A is die area and alpha is a clustering factor.
Worked figures: at D0 of 0.1 defects per square centimetre and alpha of 3,
a 100 square millimetre die yields about 90 percent, while a 600 square
millimetre die yields about 42 percent. That yield curve, not physics, is
why reticle-limit dies cost what they do.
Cost item
Rough scale, 2025
Leading-edge 300 mm wafer
18,000 to 30,000 USD
EUV mask set
Tens of millions USD
Leading-node design NRE
300 to 700 million USD
New leading-edge fab
20 billion USD and up
These figures are approximate and vary by customer, volume and contract.
Foundry pricing is confidential, so all public numbers are estimates.
Non-recurring engineering cost is now the dominant barrier to entry. That
is why only a handful of companies design at the leading node and
everything else stays on mature 28 nanometre and 16 nanometre processes.
The consequence for a software engineer: compute is cheap and
engineer-hours are expensive, so the industry trades transistors for
productivity. That trade is why abstraction layers keep multiplying.
Established fact: cost per transistor fell by orders of magnitude from 1960
to about 2012. Active debate: whether it still falls at the leading edge.
Marketing claim: any single cost-per-transistor number offered without
stating node, volume and yield assumptions.
Wrong: a transistor is a tiny mechanical switch. Right: nothing moves. A
voltage or current changes how many charge carriers are available in a
region, and that changes its conductivity.
Wrong: N-type silicon is negatively charged and P-type is positively
charged. Right: both are electrically neutral. The letters name the
majority carrier, not a net charge.
Wrong: a hole is a real positive particle. Right: it is a missing electron
in a bond. The physics lets us treat it exactly as a positive particle,
which is why the model is used, but nothing positive is moving.
Wrong: the gate of a MOSFET draws current to control the channel. Right:
the gate is insulated and draws only a tiny tunnelling leakage. That is the
whole reason CMOS logic can idle cheaply.
Wrong: saturation means the same thing in a BJT and a MOSFET. Right: BJT
saturation means fully on with a low voltage drop. MOSFET saturation means
pinched off with a nearly constant current.
Wrong: CMOS uses no power when idle. Right: it uses very little dynamic
power when idle, but leakage is paid continuously, and since about the 90
nanometre generation it has been a major share of total power.
Wrong: Moore’s Law says computers get twice as fast every 18 months. Right:
Moore’s 1965 statement was about components per chip at minimum cost,
revised in 1975 to a two-year doubling. The 18-month performance version
came from David House at Intel.
Wrong: clock speeds stopped rising because we ran out of transistor speed.
Right: they stopped because power density stopped being constant when
Dennard scaling ended, so faster clocks needed more voltage and produced
unmanageable heat.
Wrong: a “3 nanometre” process has 3 nanometre transistors. Right: node
names have been marketing labels since roughly 2011. No feature measures
the node name. Use contacted poly pitch if you want a real number.
Wrong: Shockley invented the transistor. Right: Bardeen and Brattain built
the first working device in December 1947 and are named on its patent.
Shockley invented the later junction transistor. All three shared the 1956
Nobel Prize.
A computer needs an electrically controlled switch, and the transistor is
the best one ever found.
Relays worked but had to physically move, so they were slow. Zuse’s Z3 of
1941 used about 2,600 of them at a few hertz.
Vacuum tubes were about a thousand times faster, but needed hot filaments,
burned enormous power and failed constantly. ENIAC used about 17,468 of
them and drew 150 kilowatts.
Pure silicon barely conducts, because every outer electron is locked into a
bond.
Adding phosphorus or arsenic, with five outer electrons, gives spare
electrons and makes N-type silicon.
Adding boron, with three outer electrons, leaves gaps called holes and
makes P-type silicon. A hole is an absence that moves and behaves as a
positive carrier.
One dopant atom per five million silicon atoms changes conductivity about a
million-fold. That sensitivity is why purity matters so much.
Joining N and P material makes a depletion region and a built-in voltage of
about 0.7 volts. That is a diode: easy one way, blocked the other.
Bardeen and Brattain made the first working transistor on 16 December 1947
at Bell Labs, announced on 30 June 1948, using germanium and two gold
contacts.
Shockley, left off that patent, conceived the junction transistor in
January 1948. It was working by 1951. All three shared the 1956 Nobel
Prize.
The bipolar junction transistor uses a thin base to let a small base
current control a collector current 100 to 300 times larger.
It burns power continuously, because base current can never stop while the
device is on. That cost ruled it out for large digital chips.
The MOSFET, demonstrated by Atalla and Kahng at Bell Labs in 1959 and
1960, controls a channel through an insulator using an electric field
alone.
Its gate draws essentially no current, so holding it on is free. Above the
threshold voltage the surface inverts and a channel forms.
CMOS, invented by Wanlass and Sah at Fairchild in 1963, pairs an NMOS with
a PMOS so exactly one is on in each steady state, leaving no path from
supply to ground.
Dynamic power is alpha C V squared f. A billion nodes at 0.5 femtofarads,
1 volt, 3 gigahertz and 5 percent activity gives about 75 watts.
The same device is a switch at the flat ends of its transfer curve and an
amplifier on the steep cliff between them.
Shapes changed because the gate lost control of short channels: planar
until 2011, FinFET from Intel’s 22 nanometre process in 2012, and
gate-all-around nanosheet from Samsung in 2022 and TSMC and Intel in 2025.
Moore’s 1965 observation was about components per chip at minimum cost,
revised to two years in 1975. Dennard scaling ended around 2005, power
density began rising, and cores multiplied instead of clock speeds.
The real story is price: from roughly one dollar per transistor in 1960 to
a few billionths of a dollar today. Everything else in this book rests on
that.