The dominant route is the Siemens process, developed by Siemens in Germany in
the late 1950s and still the workhorse in 2026.
Hydrochlorination runs at roughly 300 to 350 degrees Celsius.
Trichlorosilane boils at 31.8 degrees Celsius, making distillation practical.
Deposition is chemical vapour deposition onto filaments at about 1,100 to
1,150 degrees Celsius inside a water-cooled bell jar.
Conversion per pass is low, near 20 percent, so unreacted gas and silicon
tetrachloride are recycled.
Grade
Purity
Typical use
Solar, multicrystalline
7N to 8N
Standard PV cells
Solar, monocrystalline
9N to 10N
Higher-eff PV
Electronic grade
10N to 11N
Integrated circuits
The main alternative is the fluidized bed reactor route, fed with monosilane,
giving granular polysilicon at roughly one tenth of the heating electricity.
The honest version: “eleven nines” is a bulk metallic-impurity figure, not a
statement about every element.
Dopants such as boron and phosphorus are specified separately, in parts per
billion atomic or as resistivity. Carbon and oxygen are separate again.
Metrology includes glow discharge mass spectrometry, inductively coupled
plasma mass spectrometry, and photoluminescence.
Think of pulling hot toffee slowly out of a pan so it stretches into a smooth
rod instead of breaking.
Now add one rule: it can only harden by copying the pattern already above it.
The seed is that template.
Pull too fast and the pattern breaks. Pull too slow and the rod grows fat.
Spinning keeps the heat even all round.
Where this comparison breaks: toffee just cools. Each silicon atom must find
one site in a repeating three-dimensional lattice. And the crucible slowly
dissolves into the melt.
Charge polysilicon into crucible about 250 to 450 kg
Melt down under argon melts at 1414 deg C
Dip the seed crystal seed a few mm across
Neck: pull thin and fast neck about 3 mm wide
Grow the crown, widen out out to 300 mm across
Grow the body about 2 m of cylinder
Taper the tail and lift clear whole run 1 to 3 days
Pull rate through the body is around 0.5 to 1.5 millimetres per minute.
Crucible and crystal rotate in opposite directions, a few turns per minute
each.
The neck stage looks wasteful but is essential. Pulling thin and fast forces
line defects out to the surface, where they vanish.
That trick came from William Dash at General Electric around 1958. It is why
modern crystals can be dislocation-free.
Think of a very long, expensive salami sliced into perfect discs by a machine
that never wobbles.
Except the slicer is not a blade. It is one wire, hundreds of kilometres
long, wound across grooved rollers.
The wire runs at speed carrying hard particles, cutting the whole ingot into
hundreds of slices in one pass.
Where this comparison breaks: salami only needs to look right. A wafer must
be flat to a fraction of a wavelength of light, or the printing step goes out
of focus.
Boule 2 m, 265 kg
-> crop the ends lose about 10 to 20 pct
-> grind to 300.0 mm lose a few mm of radius
-> grind the notch one small notch on the edge
-> wire saw about 900 to 1200 wafers
-> lap and edge-round remove the saw damage
-> acid etch remove more damage
-> CMP one side mirror finish
-> clean and pack sealed cassettes
Slicing loses material as kerf, the width of the cut. Diamond wire kerf is
roughly 100 to 150 micrometers.
A finished 300 millimetre wafer is 775 micrometers thick, plus or minus about
25. That is standardized, not a guess.
So each wafer plus kerf uses close to 0.9 millimetres of boule, giving around
one thousand wafers from 2 metres.
A blank polished 300 millimetre prime wafer sells for very roughly 100 to 150
US dollars in volume.
Wafer geometry is set by SEMI standards: diameter, thickness, flatness, edge
profile and notch dimensions.
Diameter
Thickness
Area
Notes
150 mm (6 in)
675 um
177 sq cm
Legacy, power, MEMS
200 mm (8 in)
725 um
314 sq cm
Analog, auto, RF
300 mm (12 in)
775 um
707 sq cm
All leading-edge
450 mm (18 in)
925 um
1590 sq cm
Never commercialized
Thickness rises with diameter for stiffness. A thin 300 millimetre wafer
would sag and crack under its own weight.
Going from 200 to 300 millimetres multiplies usable area by about 2.25 for
less than 2.25 times the cost. That is the case for larger wafers.
The 450 millimetre transition stalled. The Global 450 Consortium, based in
Albany, New York, effectively collapsed around 2016 and 2017.
Reported reasons: huge tool redevelopment cost, EUV absorbing the industry’s
capital, and reluctance to fund a change helping mainly the largest players.
As of 2026 there is no credible 450 millimetre roadmap.
Processed wafer prices at leading nodes, reported by analysts in early 2026.
These are negotiated and vary by customer.
Node
Approx price per wafer
28 nm
about 3,000 USD
7 nm
about 9,500 USD
5 nm class
about 18,500 USD
2 nm class
about 30,000 USD
The honest version: the raw silicon disc is a rounding error. At the 2
nanometre class it is well under 1 percent of the finished wafer price.
When people say “sand is cheap, so chips should be cheap”, this table is the
answer. The material is cheap. The processing is not.
Air cleanliness is classified by ISO 14644-1. The older United States
standard, Federal Standard 209E, was withdrawn in 2001.
ISO class
Max particles per cu m at 0.1 um
Air changes per hour
ISO 1
10
500 to 750
ISO 2
100
500 to 750
ISO 3
1,000
500 to 750
ISO 5
100,000
250 to 300
ISO 3 corresponds roughly to the old Class 1, and ISO 5 to the old Class 100.
Modern practice is a mini-environment strategy. The bay runs at ISO 5 or 6
while the wafer sees ISO 1 inside a sealed pod and inside the tool.
Wafers travel in a Front Opening Unified Pod, a SEMI-standard carrier, moved
by an overhead hoist transport system.
Ultrapure water is specified at 18.2 megaohm-centimetre at 25 degrees
Celsius, the theoretical maximum for pure water.
Molecular contamination is controlled too. Ammonia poisons chemically
amplified photoresist, so lithography bays use chemical filtration.
Vibration is specified against generic vibration criteria curves. Advanced
lithography demands VC-E or better, near 3 micrometres per second RMS.
TSMC stated in 2025 and 2026 that a 2 nanometre fab module of about 20,000
wafer starts per month costs roughly 25 to 35 billion US dollars.
TSMC guided 2026 capital spending to roughly 60 to 64 billion US dollars.
Most of that is tools; a single EUV scanner can exceed 200 million dollars.
Standard, convention or implementation detail: ISO 14644-1 is a standard,
the bunny suit is a convention, and each bay’s class is an implementation
detail of that fab.
1 clean and prime make surface accept resist
2 spin coat resist 3000 rpm, film 30 to 200 nm
3 soft bake drive off solvent
4 align to previous match marks already on wafer
5 expose light through the reticle
6 post-exposure bake drive the resist chemistry
7 develop wash away the soluble parts
8 inspect and measure check width and overlay
9 etch cut into the layer below
10 strip resist remove the mask and clean
Now the print-and-repeat step. A standard exposure field is 26 by 33
millimetres, which is 858 square millimetres.
A 300 millimetre wafer is about 70,700 square millimetres, so the machine
prints roughly 80 fields to cover one wafer.
If each field holds four dies of about 200 square millimetres, one wafer
carries about 320 dies for that layer.
Then it does the whole thing again for the next layer. And again.
CD = k1 * wavelength / NA
DOF = k2 * wavelength / (NA * NA)
CD = smallest printable half-pitch
NA = numerical aperture of the lens
k1 = process factor, hard physical floor at 0.25
DOF = depth of focus, the focus error allowed
Three levers exist: shorter wavelength, higher numerical aperture, lower k1.
Single exposure cannot go below k1 of 0.25. That physical limit is the reason
multi-patterning exists.
Note the second formula. Numerical aperture costs depth of focus
quadratically, which is why wafer flatness is specified so tightly.
Reticles are typically 4x reduction, so 60 nanometres on the mask prints at
15 nanometres on the wafer.
Optical proximity correction distorts the mask shapes so the printed result
is correct. Sub-resolution assist features help their neighbours print.
The honest version: the mask is not a picture of the chip. It is the computed
input that yields the chip after diffraction.
History: the first commercial wafer stepper was the GCA DSW4800, introduced
in 1978. Step-and-scan replaced steppers at advanced nodes in the 1990s.
A leading-node mask set is commonly quoted at 10 to 30 million US dollars.
That is the main barrier to low-volume advanced chips.
Here is how EUV light is actually made. It is not a lamp and not a normal
laser.
tin droplet generator
| drops of molten tin, about 25 um across
| released about 50,000 times per second
v
[ pre-pulse laser ] -> flattens the drop into a disc
|
v
[ main pulse laser ] -> vaporizes it into hot plasma
|
v
plasma over 200,000 degrees emits 13.5 nm light
|
v
collector mirror -> multilayer mirrors -> reticle
|
v
more mirrors -> wafer
A carbon dioxide laser of over ten kilowatts average power fires twice at
each falling droplet.
The first shot squashes the sphere flat. The second turns it into plasma, an
extremely hot ionized gas radiating at 13.5 nanometres.
Everything absorbs this light. Air absorbs it, glass absorbs it. So there are
no lenses, and the path must be in vacuum.
Instead the machine uses mirrors of about forty to fifty alternating pairs of
molybdenum and silicon, each layer a few nanometres thick.
Even those reflect only around 70 percent. After ten bounces most of the
light is gone, which is why source power is such a struggle.
The reticle is a mirror too, not a transparent plate. That is a fundamental
break from all earlier lithography.
Tin debris coats the collector and shortens its life, so hydrogen gas is
flowed through to clean it.
The 157 nanometre fluorine laser generation was researched hard and abandoned
around 2003, because 193 immersion proved cheaper and better.
Immersion entered volume production around 2007, with water enabling
numerical apertures up to 1.35.
EUV entered high-volume manufacturing in 2019, first at Samsung and TSMC for
7 nanometre class layers.
Low numerical aperture tools such as the ASML TWINSCAN NXE:3800E have
numerical aperture 0.33 and are reported at 180 to 220 million US dollars.
High numerical aperture EUV, the TWINSCAN EXE:5200 family, has numerical
aperture 0.55 and is reported at about 380 million US dollars per tool.
Anamorphic means the reduction differs by axis, 4x one way and 8x the other.
The field halves to about 26 by 16.5 millimetres, so large dies are stitched.
ASML of Veldhoven, the Netherlands, is the only supplier of EUV scanners.
Zeiss SMT supplies the optics and TRUMPF the carbon dioxide laser, both of
Germany. The tin source traces to Cymer, now part of ASML.
Where experts disagree: whether High-NA EUV beats low-NA plus double
patterning on cost per layer. Intel has pushed High-NA; some analysts
disagree. As of 2026 this is unsettled.
Established fact: EUV works and is in volume production. Active research:
higher source power and dry resists. Marketing claim: any statement that a
named node “requires” High-NA today.
Here is the damascene method, which is how the copper wiring is made.
Start: a flat insulating layer over the transistors
1 etch a trench and a via hole into the insulator
2 line the hole with a thin barrier film (TaN/Ta)
3 sputter a thin copper seed layer
4 electroplate copper until it overflows the trench
5 polish the whole surface flat with CMP
6 the only copper left is inside the trench
Result: a wire buried in glass, top surface perfectly flat
Notice what did not happen. We never etched copper. Copper is hard to etch
cleanly, so we cut the shape first and fill it.
That is damascene, named after the inlay metalwork of Damascus. Doing trench
and vertical connection in one fill is dual damascene.
Repeat fifteen or more times, with wires getting wider and thicker as you go
up.
Bottom layers carry signals inside one circuit block. Top layers are thick
and carry power across the chip.
The gate insulator was silicon dioxide for about forty years. Intel replaced
it with hafnium-based high-k plus metal gates at 45 nanometres in 2007.
The honest version: since 2007 “gate oxide” is largely historical. The layer
is a hafnium oxide film laid by atomic layer deposition.
Interconnect switched from aluminum to copper. IBM announced copper
interconnect in 1997, using dual damascene with CMP.
Copper needs a barrier, historically tantalum nitride and tantalum, because
copper diffuses into silicon and poisons devices.
Dielectrics moved from silicon dioxide, near 3.9, to carbon-doped low-k films
near 2.5 to 3.0, to cut wire capacitance.
Advanced logic in 2026 uses 15 to 20 metal levels, from roughly 20 to 30
nanometre pitch at the bottom to micrometres at the top.
Backside power delivery is the current change. Intel calls its version
PowerVia, shipped in 18A; TSMC’s equivalent arrives with A16.
Step counts: advanced logic is commonly described as more than 1,000 process
steps with roughly 80 to 100 mask layers. Exact counts are confidential, so
treat these as approximate.
Cycle time: a leading-edge logic wafer spends about 3 months in the fab,
often quoted as 12 to 16 weeks. With packaging and test, four to five months.
Wafer probe, or wafer sort, is the first electrical test. A probe card with
hundreds of needles contacts the pads, often at several voltages and
temperatures.
Dicing separates the dies. A diamond blade saw is traditional. Laser stealth
dicing makes a weak plane inside the silicon, then the wafer is stretched and
splits.
Die attach fixes the die down, face up on a pad or face down onto a
substrate.
Wire bonding joins the die pads to the package with fine gold or copper
wires, welded by heat and ultrasound. Cheap and mature.
Flip-chip turns the die upside down and connects through solder bumps across
the whole face, allowing many more connections and shorter power paths.
Above the die goes a lid or heat spreader, joined by a thermal interface
material: a paste, a pad, or soldered metal.
Underneath sits the substrate, a small multilayer board fanning fine
connections out to larger solder balls or pins.
Chiplets change the picture. Several dies sit on a shared carrier and behave
as one product.
Yield is modelled from defect density. Two standard forms are used.
Poisson: Y = exp(-A * D0)
Murphy: Y = ((1 - exp(-A * D0)) / (A * D0)) ^ 2
A = die area in square centimetres
D0 = defect density per square centimetre
Murphy’s model is usually closer to reality, because defects cluster rather
than spreading evenly.
Mature high-volume nodes run D0 near 0.05 to 0.1 per square centimetre. A new
node starts far worse and improves over quarters.
Reported N2 test-chip yields in early 2026 were about 70 to 80 percent for
TSMC, with Intel and Samsung lower. These are press reports, not disclosure.
Binning sorts by maximum stable frequency, leakage, and functional core
count. Fusing off a defective core is normal and deliberate.
The reticle limit sets the largest single die at about 26 by 33 millimetres,
858 square millimetres, at low numerical aperture EUV.
2.5D packaging places multiple dies on a silicon interposer. TSMC’s platform
is CoWoS, introduced in 2012; Intel’s bridge alternative is EMIB.
3D packaging stacks dies with through-silicon vias. Examples are Intel
Foveros, announced 2018, and TSMC SoIC.
High Bandwidth Memory is a JEDEC standard: stacked DRAM joined by
through-silicon vias, placed beside the logic die. HBM4 was standardized in
2025.
Product
Year
Transistors
NVIDIA H100
2022
80 billion
NVIDIA B200
2024
208 billion, 2 dies
Cerebras WSE-3
2024
4 trillion
NVIDIA Rubin
announced 2026
336 billion, 4 tiles
The known good die problem is central. Stacking three good dies with one bad
one wastes all four, so pre-assembly test coverage must be very high.
Advanced packaging capacity, not wafer capacity, has been the binding
constraint on artificial intelligence accelerator supply since 2023.
Think of a garden hose with a hand squeezing it. The hand is the gate; the
water is the current.
Flat transistors are a hose on the ground with one hand pressing from the
top. It works, but water leaks past.
A FinFET stands the hose on edge so the hand grips three sides. Much better
control, much less leak.
Gate-all-around wraps the hand fully around the hose, with several thin hoses
stacked above one another.
That is why the industry moved: at small sizes a flat gate simply stopped
being able to turn the current off.
Where this comparison breaks: no water flows. Current is carried by electrons
or holes, and “off” means suppressing quantum tunnelling and thermal leakage.
Planar bulk MOSFET dominated from the 1960s to about 2011.
The FinFET concept was demonstrated as DELTA by Hisamoto and colleagues at
Hitachi in 1989.
It was then developed and named FinFET at the University of California,
Berkeley around 1999, by a team including Chenming Hu, Tsu-Jae King Liu and
Jeffrey Bokor.
Intel put it into volume production first, as Tri-Gate at 22 nanometres,
announced 2011 and shipping 2012.
Gate-all-around nanosheet reached mass production first at Samsung, with 3GAE
in 2022.
TSMC moved to nanosheet at N2, starting mass production in late 2025 at Fab
20 in Hsinchu and ramping through 2026.
Reported N2 wafer price is about 30,000 US dollars, against roughly 20,000 to
25,000 for 3 nanometre class.
Intel 18A, with RibbonFET gate-all-around plus PowerVia backside power,
entered high-volume manufacturing in 2025 with Panther Lake.
Where experts disagree: how to compare nodes fairly. Density metrics weighted
across cell types are contested, and there is no neutral referee.
Established fact: nanosheet is in production in 2026. Active research:
complementary FET, stacking n-type and p-type vertically, and
two-dimensional channel materials. Marketing claim: node names as
measurements.
The honest version: if someone says a 3 nanometre chip has 3 nanometre
features, they are repeating a press release. Ask for gate pitch and
density.
Think of book publishing. An author writes, a printing plant prints, and a
typeface company licenses the letterforms.
Fabless chip companies are the authors. Foundries are the printing plants,
owning the expensive machines and printing for whoever pays.
ARM is the typeface company. Nobody buys a typeface alone, but almost every
book uses one, and the fee is small per copy and huge in total.
RISC-V is a typeface released free for anyone to use and modify.
Where this comparison breaks: there are thousands of printing plants. There
are fewer than five organizations that can print at the leading edge, and one
supplier of the key machine.
TSMC was founded in 1987 by Morris Chang and created the pure-play foundry
model. Before that, building for others was a side business.
Early fabless companies include Xilinx, founded 1984, Qualcomm, founded 1985,
and NVIDIA, founded 1993.
ARM was founded in 1990 as Advanced RISC Machines, a joint venture of Acorn
Computers, Apple and VLSI Technology.
ARM licences come in two tiers: core licences, where you use ARM’s design,
and architecture licences, where you build your own compatible core. Apple
holds the latter.
RISC-V began at the University of California, Berkeley in 2010. RISC-V
International moved its legal home to Switzerland in 2020.
Important distinction: RISC-V being open does not make any particular RISC-V
chip open. The instruction set is open; implementations may be proprietary.
Market share: TSMC held roughly 67 to 71 percent of the global foundry market
in early 2026, depending on the analyst. Its leading-edge share is higher.
In materials, Shin-Etsu Chemical and SUMCO, both Japanese, supply most of the
world’s 300 millimetre polished wafers.
TSMC’s Arizona site began 4 nanometre class production in 2024. The company
has announced about 265 billion US dollars of United States investment.
Established fact: leading-edge capacity is concentrated in Taiwan and South
Korea. Active development: Arizona, Japan and Dresden fabs ramping.
Marketing claim: that any subsidy programme has already ended that
concentration.
To see part of this chain yourself: on Linux, lscpu reports vendor and
microarchitecture; on macOS, sysctl -n machdep.cpu.brand_string names the
part.
Wrong: chips are made from ordinary beach sand. Right: they are made from
selected lump quartz or quartzite above 99 percent silica, chosen for low
iron content.
Wrong: silicon is mined as a metal. Right: silicon never occurs pure. It is
always bound to oxygen and must be reduced out with carbon at about 1,900
degrees Celsius.
Wrong: 99 percent pure is good enough. Right: that is one foreign atom in a
hundred. Chips need nine to eleven nines, roughly one per billion or better.
Wrong: a wafer is just a slice of purified silicon. Right: it must be one
single crystal with no grain boundaries, grown from a seed, with specified
orientation and resistivity.
Wrong: the mask is a stencil shaped like the circuit. Right: it is a 4x
enlarged plate of computed shapes, distorted by optical proximity correction
so the printed result is correct.
Wrong: EUV is just a brighter ultraviolet lamp. Right: it is 13.5 nanometre
soft X-ray light made by vaporizing tin droplets, absorbed by air and glass,
so it needs vacuum and mirrors.
Wrong: a 3 nanometre chip has 3 nanometre features. Right: the node name is a
marketing label. Gate pitch on a 3 nanometre class process is around 45
nanometres.
Wrong: sand is cheap, so chips should be cheap. Right: the blank wafer is
well under 1 percent of a processed leading-edge wafer. The value is in more
than a thousand process steps.
Wrong: a faster and a slower processor from one family are different designs.
Right: they are frequently the same die, binned by measured performance,
sometimes with defective parts fused off.
Wrong: making the chip is hard and packaging is trivial. Right: since 2023,
advanced packaging capacity rather than wafer capacity has limited
artificial intelligence accelerators.
Silicon is about 27.7 percent of the Earth’s crust by mass, second only to
oxygen, and never occurs pure.
It is locked in silica and silicate minerals, and the cleanest common source
is the mineral quartz.
Chip feedstock is lump quartz or quartzite above 99 percent silica, not beach
sand, for both purity and particle size.
A submerged-arc furnace at about 1,900 degrees Celsius reduces quartz with
carbon, giving metallurgical-grade silicon at 98 to 99.5 percent.
That silicon becomes trichlorosilane, is distilled, and is deposited back
onto hot filaments by the Siemens process at about 1,100 degrees Celsius.
The result is polysilicon at nine to eleven nines purity, roughly one foreign
atom per billion or fewer.
Polysilicon is melted and regrown as one single crystal by the Czochralski
method, using a seed, a thin neck, and slow rotating pulling.
A 300 millimetre boule is about 2 metres long and weighs about 265 kilograms,
with a defined orientation and dopant level.
Float-zone growth gives purer, higher-resistivity silicon without a crucible,
but is limited in diameter and used for power and detector devices.
The boule is cropped, ground, notched, wire sawn, lapped, etched and
polished into 775 micrometer mirror wafers.
300 millimetres is the industry limit. The 450 millimetre transition stalled
when its consortium collapsed around 2016 and 2017.
Fabs run at ISO 14644-1 cleanliness with hundreds of air changes per hour,
ultrapure water at 18.2 megaohm-centimetre, and vibration isolation.
A 2 nanometre class fab module costs roughly 25 to 35 billion US dollars,
most of it tools rather than building.
Photolithography prints one 26 by 33 millimetre field at a time through a 4x
reticle, then steps across the wafer and repeats.
Resolution follows the Rayleigh criterion, so shorter wavelength and higher
numerical aperture give smaller features, at the cost of depth of focus.
Light went from 436 and 365 nanometre mercury lamps, to 248 and 193
nanometre lasers, to 193 nanometre immersion, to 13.5 nanometre EUV.
EUV comes from tin droplets struck twice by a carbon dioxide laser, 50,000
times a second, focused by molybdenum-silicon mirrors in vacuum, and only
ASML builds the machine.
Doping, annealing, oxidation, CVD, PVD, ALD and 15 or more copper damascene
metal layers add up to over 1,000 process steps and about three months in
the fab.
Wafers are probe tested, binned, diced and packaged, and defect density
punishes large dies so hard that the industry moved to chiplets, interposers
and stacked memory.
Node names are marketing labels, transistors went planar to FinFET to
gate-all-around, and the ability to build at the leading edge sits in very
few hands.